Absorbing
materials are widely applied in applications of wireless communication. It is
of great importance to measure and characterize these materials efficiently and
precisely.
In this paper,
the author first utilizes transmission line methods to acquire scattering
parameters, which are used as input in the parameter retrieval process for EM
properties. After successful
characterization of these materials, EM properties
are imported in commercialized software for simulation of reflectivity.
For comparison,
NRL arch reflectivity test is conducted and good comparison is found.
Discrepancy between the two is analyzed in this paper.
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