Absorbing
materials are widely applied in applications of wireless communication. It is
of great importance to measure and characterize these materials efficiently and
precisely.
In this paper,
the author first utilizes transmission line
methods to acquire scattering parameters, which are used
as input in the parameter retrieval process for EM properties.
After successful
characterization of these materials, EM properties are imported in
commercialized software for simulation of reflectivity. For comparison, NRL
arch reflectivity test is conducted and good comparison is found. Discrepancy
between the two is analyzed in this paper.
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